Výsledky vyhledávání
- 1.0304012 - URE-Y 20020103 HU eng A - Abstrakt
Vaniš, Jan - Chow, D. H. - Pangrác, Jiří - Šroubek, Filip - McGill, T. C. - Walachová, Jarmila
Characterization of InAs/AlSb tunneling double barrier heterostructure by ballistic electron emission microscope BEEM with InAs as based electrode.
Budapest: Rese, 2002. Book of Abstracts EXMATEC'2002. s. 176
[EXMATEC 2002 - International Workshop on Expert Evaluation & Control of Compounds Semiconductor Materials & Technologies /6./. 26.05.2002-29.05.2002, Budapest]
Grant CEP: GA AV ČR KSK1010104 Projekt 04/01:4045
Výzkumný záměr: CEZ:AV0Z2067918
Klíčová slova: field emission electron microscopy * semiconductor qunatum wells * spectroscopy
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Trvalý link: http://hdl.handle.net/11104/0114156 - 2.0303328 - URE-Y 980117 CZ eng A - Abstrakt
Walachová, Jarmila - Zelinka, Jiří - Vaniš, Jan - Chow, D. H. - Karamazov, Simeon - Cukr, Miroslav - Zich, P. - McGill, T. C.
Testing of quantum well structures by BEEM/BEES.
Prague: IREE AS CR, 1998. ISBN 80-86269-019. AMFO'98. - (Procházková, O.). s. 14
[Czech-Chinese Workshop on Advanced Materials for Optoelectronics - AMFO'98. 15.06.1998-17.06.1998, Prague]
Grant CEP: GA ČR GA102/97/0427
Klíčová slova: nanostructured materials * spectroscopy * semiconductor quantum wells
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0113574 - 3.0105892 - URE-Y 20040171 FR eng A - Abstrakt
Vaniš, Jan - Chow, D. H. - Šroubek, Filip - McGill, T. C. M. - Walachová, Jarmila
Characterization of InAs/AlSb tunneling double barrier heterostructure by reverse ballistic electron emission spectroscoipy with InAs as base electrode.
7th International Workshop on Expert Evaluation & Control of Compound Semiconductor Materials & Technologies - EXMATEC'2004. [Montpellier]: [GES], 2004. s. 164.
[EXMATEC 2004 - International Workshop on Expert Evaluation & Control of Compounds Semiconductor Materials & Technologies /7./. 01.06.2004-04.06.2004, Montpellier]
Grant CEP: GA AV ČR(CZ) KSK1010104
Klíčová slova: scanning tunelling microscopy * ballistic transport * semiconductor heterojunctions
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Trvalý link: http://hdl.handle.net/11104/0013080