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0524885 - ÚPT 2021 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Skoupý, Radim - Krzyžánek, Vladislav
Determination of thickness refinement using STEM detector segments.
10th Anniversary International Conference on Nanomaterials - Research and Application (NANOCON 2018). Ostrava: Tanger, 2019, s. 677-681. ISBN 978-80-87294-89-5.
[Anniversary International Conference on Nanomaterials - Research and Application (NANOCON) /10./. Brno (CZ), 17.10.2018-19.10.2018]
Grant CEP: GA ČR GA17-15451S; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institucionální podpora: RVO:68081731
Klíčová slova: electron-microscopy * Quantitative STEM * thickness determination * detector segments * Monte Carlo simulation
Obor OECD: Electrical and electronic engineering
Trvalý link: http://hdl.handle.net/11104/0309122
Skoupý, Radim - Krzyžánek, Vladislav
Determination of thickness refinement using STEM detector segments.
10th Anniversary International Conference on Nanomaterials - Research and Application (NANOCON 2018). Ostrava: Tanger, 2019, s. 677-681. ISBN 978-80-87294-89-5.
[Anniversary International Conference on Nanomaterials - Research and Application (NANOCON) /10./. Brno (CZ), 17.10.2018-19.10.2018]
Grant CEP: GA ČR GA17-15451S; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institucionální podpora: RVO:68081731
Klíčová slova: electron-microscopy * Quantitative STEM * thickness determination * detector segments * Monte Carlo simulation
Obor OECD: Electrical and electronic engineering
Trvalý link: http://hdl.handle.net/11104/0309122