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0501462 - FZÚ 2019 RIV CH eng M - Část monografie knihy
Ondráček, Martin - Hapala, Prokop - Švec, Martin - Jelínek, Pavel
Imaging charge distribution within molecules by scanning probe microscopy.
Kelvin probe force microscopy. Cham: Springer International Publishing, 2018 - (Sadewasser, S.; Glatzel, T.), s. 499-518. Springer Series in Surface Sciences, 65. ISBN 978-3-319-75686-8
Grant CEP: GA ČR GJ17-24210Y
Grant ostatní: AV ČR(CZ) Praemium Academiae
Institucionální podpora: RVO:68378271
Klíčová slova: charge distribution * surfaces * molecules * Kelvin probe force microscopy * scanning quantum dot microscopy * high resolution atomic force microscopy
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Trvalý link: http://hdl.handle.net/11104/0293485
Ondráček, Martin - Hapala, Prokop - Švec, Martin - Jelínek, Pavel
Imaging charge distribution within molecules by scanning probe microscopy.
Kelvin probe force microscopy. Cham: Springer International Publishing, 2018 - (Sadewasser, S.; Glatzel, T.), s. 499-518. Springer Series in Surface Sciences, 65. ISBN 978-3-319-75686-8
Grant CEP: GA ČR GJ17-24210Y
Grant ostatní: AV ČR(CZ) Praemium Academiae
Institucionální podpora: RVO:68378271
Klíčová slova: charge distribution * surfaces * molecules * Kelvin probe force microscopy * scanning quantum dot microscopy * high resolution atomic force microscopy
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Trvalý link: http://hdl.handle.net/11104/0293485