Vytisknout
0481338 - ÚPT 2018 CN eng A - Abstrakt
Mikmeková, Eliška - Paták, Aleš - Frank, Luděk - Sluyterman, S.
Scanning Ultra-Low-Energy Electron Microscopy of 2D Crystals.
BIT's 5th Annual Conference of AnalytiX-2017. Conference Abstract Book. Dalian: BIT Goup Global, 2017. s. 224.
[BIT's Annual Conference of AnalytiX-2017 /5./. 22.03.2017-24.03.2017, Fukuoka]
Institucionální podpora: RVO:68081731
Klíčová slova: ultra-Low-Energy Electron Microscopy * scanning * 2D Crystals
Obor OECD: Coating and films
Trvalý link: http://hdl.handle.net/11104/0276916
Mikmeková, Eliška - Paták, Aleš - Frank, Luděk - Sluyterman, S.
Scanning Ultra-Low-Energy Electron Microscopy of 2D Crystals.
BIT's 5th Annual Conference of AnalytiX-2017. Conference Abstract Book. Dalian: BIT Goup Global, 2017. s. 224.
[BIT's Annual Conference of AnalytiX-2017 /5./. 22.03.2017-24.03.2017, Fukuoka]
Institucionální podpora: RVO:68081731
Klíčová slova: ultra-Low-Energy Electron Microscopy * scanning * 2D Crystals
Obor OECD: Coating and films
Trvalý link: http://hdl.handle.net/11104/0276916