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0379933 - ÚPT 2012 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Müllerová, Ilona - Konvalina, Ivo - Mika, Filip
Collection contrast in the immersion objective lens of the scanning electron microscope.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), -, -, s. 49-50. ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
Grant CEP: GA MPO FR-TI3/323
Institucionální podpora: RVO:68081731
Klíčová slova: scanning electron microscope * cathode lens * secondary electrons * backscattered electrons
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0210780
Müllerová, Ilona - Konvalina, Ivo - Mika, Filip
Collection contrast in the immersion objective lens of the scanning electron microscope.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), -, -, s. 49-50. ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
Grant CEP: GA MPO FR-TI3/323
Institucionální podpora: RVO:68081731
Klíčová slova: scanning electron microscope * cathode lens * secondary electrons * backscattered electrons
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0210780