Vytisknout
0352686 - ÚPT 2011 SK eng A - Abstrakt
Hrabina, Jan - Lazar, Josef - Číp, Ondřej - Čížek, Martin
Laser source for interferometry in nanotechnology.
17th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Žilina: Žilinská univerzita, 2010. s. 63. ISBN 978-80-554-0238-3.
[Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics /17./. 06.09.2010, Liptovsky Jan]
Grant CEP: GA MŠMT(CZ) LC06007; GA MŠMT 2C06012; GA MPO 2A-1TP1/127; GA MPO FT-TA3/133; GA MPO 2A-3TP1/113; GA ČR GA102/09/1276; GA ČR GA102/07/1179
Výzkumný záměr: CEZ:AV0Z20650511
Klíčová slova: atomic force microscopy * nanometrology * interferometry
Kód oboru RIV: BH - Optika, masery a lasery
Trvalý link: http://hdl.handle.net/11104/0192146
Hrabina, Jan - Lazar, Josef - Číp, Ondřej - Čížek, Martin
Laser source for interferometry in nanotechnology.
17th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Žilina: Žilinská univerzita, 2010. s. 63. ISBN 978-80-554-0238-3.
[Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics /17./. 06.09.2010, Liptovsky Jan]
Grant CEP: GA MŠMT(CZ) LC06007; GA MŠMT 2C06012; GA MPO 2A-1TP1/127; GA MPO FT-TA3/133; GA MPO 2A-3TP1/113; GA ČR GA102/09/1276; GA ČR GA102/07/1179
Výzkumný záměr: CEZ:AV0Z20650511
Klíčová slova: atomic force microscopy * nanometrology * interferometry
Kód oboru RIV: BH - Optika, masery a lasery
Trvalý link: http://hdl.handle.net/11104/0192146