Vytisknout
0498772 - ÚPT 2019 RIV NL eng J - Článek v odborném periodiku
Dapor, M. - Masters, R. - Ross, I. - Lidzey, D. - Pearson, A. - Abril, I. - Garcia-Molina, R. - Sharp, J. - Unčovský, M. - Vystavěl, T. - Mika, Filip - Rodenburg, C.
Secondary electron spectra of semi-crystalline polymers A novel polymer characterisation tool?
Journal of Electron Spectroscopy and Related Phenomena. Roč. 222, JAN (2018), s. 95-105. ISSN 0368-2048. E-ISSN 1873-2526
Institucionální podpora: RVO:68081731
Klíčová slova: energy * microscope * films * semiconductors * spectroscopy
Obor OECD: Coating and films
Impakt faktor: 1.343, rok: 2018
Trvalý link: http://hdl.handle.net/11104/0291039
Dapor, M. - Masters, R. - Ross, I. - Lidzey, D. - Pearson, A. - Abril, I. - Garcia-Molina, R. - Sharp, J. - Unčovský, M. - Vystavěl, T. - Mika, Filip - Rodenburg, C.
Secondary electron spectra of semi-crystalline polymers A novel polymer characterisation tool?
Journal of Electron Spectroscopy and Related Phenomena. Roč. 222, JAN (2018), s. 95-105. ISSN 0368-2048. E-ISSN 1873-2526
Institucionální podpora: RVO:68081731
Klíčová slova: energy * microscope * films * semiconductors * spectroscopy
Obor OECD: Coating and films
Impakt faktor: 1.343, rok: 2018
Trvalý link: http://hdl.handle.net/11104/0291039