Vytisknout
0499741 - ÚACH 2019 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Stuchlík, J. - Fajgar, R. - Remeš, Z. - Kupčík, Jaroslav - Stuchlíková, H.
Characterization of hydrogenated silicon thin films and diode structures with integrated germanium nanoparticles.
Nanocon 2017 : conference proceedings : 9th International Conference on Nanomaterials - Research & Application. Ostrava: Tanger Ltd., 2018, /2018/, s.123-127. ISBN 9788087294819.
[NANOCON 2017. International Conference on Nanomaterials - Research & Application /9./. Brno (CZ), 18.10.2017-20.10.2017]
Institucionální podpora: RVO:61388980
Klíčová slova: PECVD * a-Si: H * PIN diode * Ge * nanoparticles
Obor OECD: Inorganic and nuclear chemistry
Trvalý link: http://hdl.handle.net/11104/0292719
Stuchlík, J. - Fajgar, R. - Remeš, Z. - Kupčík, Jaroslav - Stuchlíková, H.
Characterization of hydrogenated silicon thin films and diode structures with integrated germanium nanoparticles.
Nanocon 2017 : conference proceedings : 9th International Conference on Nanomaterials - Research & Application. Ostrava: Tanger Ltd., 2018, /2018/, s.123-127. ISBN 9788087294819.
[NANOCON 2017. International Conference on Nanomaterials - Research & Application /9./. Brno (CZ), 18.10.2017-20.10.2017]
Institucionální podpora: RVO:61388980
Klíčová slova: PECVD * a-Si: H * PIN diode * Ge * nanoparticles
Obor OECD: Inorganic and nuclear chemistry
Trvalý link: http://hdl.handle.net/11104/0292719