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0464548 - ÚPT 2017 RIV GB eng C - Konferenční příspěvek (zahraniční konf.)
Řeřucha, Šimon - Yacoot, A. - Pham, Minh Tuan - Čížek, Martin - Hucl, Václav - Lazar, Josef - Číp, Ondřej
Stabilized semiconductor laser source for high-resolution interferometry.
EUSPEN 2016. Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology. Nottingham: Euspen, 2016, 1.3.1-1.3.3. ISBN 978-095667908-6.
[EUSPEN 2016. International Conference of the European Society for Precision Engineering and Nanotechnology /16./. Nottingham (GB), 30.05.2016-03.06.2016]
Grant CEP: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA ČR GB14-36681G; GA TA ČR TE01020233
Institucionální podpora: RVO:68081731
Klíčová slova: DBR * diode laser * iodine stabilization * laser interferometry * optical metrology
Kód oboru RIV: BH - Optika, masery a lasery
Trvalý link: http://hdl.handle.net/11104/0265157
Řeřucha, Šimon - Yacoot, A. - Pham, Minh Tuan - Čížek, Martin - Hucl, Václav - Lazar, Josef - Číp, Ondřej
Stabilized semiconductor laser source for high-resolution interferometry.
EUSPEN 2016. Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology. Nottingham: Euspen, 2016, 1.3.1-1.3.3. ISBN 978-095667908-6.
[EUSPEN 2016. International Conference of the European Society for Precision Engineering and Nanotechnology /16./. Nottingham (GB), 30.05.2016-03.06.2016]
Grant CEP: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA ČR GB14-36681G; GA TA ČR TE01020233
Institucionální podpora: RVO:68081731
Klíčová slova: DBR * diode laser * iodine stabilization * laser interferometry * optical metrology
Kód oboru RIV: BH - Optika, masery a lasery
Trvalý link: http://hdl.handle.net/11104/0265157