Vytisknout
0495050 - FZÚ 2019 RIV US eng J - Článek v odborném periodiku
Milov, I. - Lipp, V. - Medvedev, Nikita - Makhotkin, I.A. - Louis, E. - Bijkerk, F.
Modeling of XUV-induced damage in Ru films: the role of model parameters.
Journal of the Optical Society of America. B. Roč. 35, č. 10 (2018), B43-B53. ISSN 0740-3224. E-ISSN 1520-8540
Grant CEP: GA MŠMT LG15013; GA MŠMT LTT17015
Institucionální podpora: RVO:68378271
Klíčová slova: faser damage * free-electron lasers * X-rays * soft x-rays * extreme ultraviolet (EUV) * metals * thin film
Obor OECD: Optics (including laser optics and quantum optics)
Impakt faktor: 2.284, rok: 2018
Trvalý link: http://hdl.handle.net/11104/0288077
Milov, I. - Lipp, V. - Medvedev, Nikita - Makhotkin, I.A. - Louis, E. - Bijkerk, F.
Modeling of XUV-induced damage in Ru films: the role of model parameters.
Journal of the Optical Society of America. B. Roč. 35, č. 10 (2018), B43-B53. ISSN 0740-3224. E-ISSN 1520-8540
Grant CEP: GA MŠMT LG15013; GA MŠMT LTT17015
Institucionální podpora: RVO:68378271
Klíčová slova: faser damage * free-electron lasers * X-rays * soft x-rays * extreme ultraviolet (EUV) * metals * thin film
Obor OECD: Optics (including laser optics and quantum optics)
Impakt faktor: 2.284, rok: 2018
Trvalý link: http://hdl.handle.net/11104/0288077