Košík

0581983 - ÚFM 2025 RIV GB eng J - Článek v odborném periodiku
Govind, K. - Oliveros, D. - Dlouhý, Antonín - Legros, M. - Sandfeld, S.
Deep learning of crystalline defects from TEM images: a solution for the problem of 'never enough training data'.
MACHINE LEARNING-SCIENCE AND TECHNOLOGY. Roč. 5, č. 1 (2024), č. článku 015006. E-ISSN 2632-2153
Institucionální podpora: RVO:68081723
Klíčová slova: situ * insights * deep learning * synthetic training data * segmentation * data mining * transmission electron microscopy * dislocation * crystal defect
Obor OECD: Computer sciences, information science, bioinformathics (hardware development to be 2.2, social aspect to be 5.8)
Způsob publikování: Open access
https://iopscience.iop.org/article/10.1088/2632-2153/ad1a4e
Trvalý link: https://hdl.handle.net/11104/0350122