0553018 - ÚPT 2022 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Allaham, Mohammad M. - Knápek, Alexandr - Mousa, M. S. - Forbes, R. G.User-friendly method for testing field electron emission data: Technical report.
International Vacuum Nanoelectronics Conference. In:
2021 34th International Vacuum Nanoelectronics Conference (IVNC). New York: IEEE, 2021 - (Purcell, S.; Mazellier, J.), (2021), s. 138-139. ISBN 978-1-6654-2589-6. ISSN 2380-6311.
[International Vacuum Nanoelectronics Conference (IVNC) /34./. online (FR), 05.07.2021-09.07.2021]
Grant CEP: GA MV(CZ) VI20192022147
Institucionální podpora: RVO:68081731
Klíčová slova: field emission analysis tool * Murphy-Good plot * voltage conversion length * field enhancement factor * formal emission area * formal area efficiency
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
https://ieeexplore.ieee.org/document/9600769
Trvalý link: http://hdl.handle.net/11104/0328068
