Košík

0520350 - FZÚ 2020 RIV NL eng J - Článek v odborném periodiku
Zemek, Josef - Houdková, Jana - Jiříček, Petr - Ižák, Tibor - Kalbáč, Martin
Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy.
Applied Surface Science. Roč. 491, Oct (2019), s. 16-23. ISSN 0169-4332. E-ISSN 1873-5584
Grant CEP: GA MŠMT(CZ) EF16_019/0000760; GA MŠMT(CZ) LM2015088; GA ČR GF16-34856L; GA MŠMT(CZ) LTC18039
Grant ostatní: OP VVV - SOLID21(XE) CZ.02.1.01/0.0/0.0/16_019/0000760
Institucionální podpora: RVO:68378271 ; RVO:61388955
Klíčová slova: single-layer graphene * Raman spectroscopy * X-ray-induced Auger electron spectroscopy (XAES) * angular-resolved core-level photoelectron spectroscopy (ARXPS) * maximum entropy method * concentration depth profile reconstruction
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.); Physical chemistry (UFCH-W)
Impakt faktor: 6.182, rok: 2019
Způsob publikování: Omezený přístup
https://doi.org/10.1016/j.apsusc.2019.06.083
Trvalý link: http://hdl.handle.net/11104/0305033