Košík

0503533 - ÚFP 2019 RIV NL eng J - Článek v odborném periodiku
Vozda, V. - Burian, Tomáš - Chalupský, J. - Dědič, V. - Hájková, V. - Hlídek, P. - Juha, Libor - Kozlová, Michaela - Krůs, Miroslav - Kunc, J. - Rejhon, M. - Vyšín, L. - Rocca, J.J. - Franc, J.
Micro-Raman mapping of surface changes induced by XUV laser radiation in cadmium telluride.
Journal of Alloys and Compounds. Roč. 763, 30. 9. 2018 (2018), s. 662-669. ISSN 0925-8388. E-ISSN 1873-4669
Grant CEP: GA MŠMT LTT17015; GA MŠMT(CZ) LM2015083
Institucionální podpora: RVO:61389021
Klíčová slova: afm * Atomic force microscopy * Crystal structure * Impurities in semiconductors * Laser processing * Luminescence * Semiconductors
Obor OECD: Fluids and plasma physics (including surface physics)
Impakt faktor: 4.175, rok: 2018
https://www.sciencedirect.com/science/article/pii/S0925838818320693?via%3Dihub
Trvalý link: http://hdl.handle.net/11104/0295352