Košík

0495576 - ÚFM 2019 RIV GB eng J - Článek v odborném periodiku
Elhadidy, Hassan - Grill, R. - Franc, J. - Moravec, P. - Musiienko, A. - Dědic, V. - Korcsmaros, G. - Schneeweiss, Oldřich
Study of electromigration phenomena in Au/p-type CdTe with two Schottky contacts.
Journal of Instrumentation. Roč. 13, OCT (2018), č. článku C10002. ISSN 1748-0221. E-ISSN 1748-0221
Grant CEP: GA MŠMT(CZ) LQ1601
Institucionální podpora: RVO:68081723
Klíčová slova: semiconductor-metal structure * semiinsulating cdte * diffusion * cu * impurities * defects * ag * Charge transport and multiplication in solid media * Gamma detectors (scintillators, CZT, HPG, HgI etc) * X-ray detectors
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 1.366, rok: 2018
Trvalý link: http://hdl.handle.net/11104/0289764