Košík

0494367 - ÚPT 2019 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Mika, Filip - Pokorná, Zuzana - Konvalina, Ivo - Khursheed, A.
Possibilites of a secondary electrons bandpass filter for standard SEM.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 46-47. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
Grant CEP: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institucionální podpora: RVO:68081731
Klíčová slova: secondary electron * filtering * imaging
Obor OECD: Coating and films
Trvalý link: http://hdl.handle.net/11104/0288493