Košík

0494360 - ÚPT 2019 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Mikmeková, Šárka - Konvalina, Ivo - Frank, Luděk - Müllerová, Ilona
Very low energy electron transmission spectromicroscopy.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 14-15. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
GRANT EU: European Commission(XE) 606988 - SIMDALEE2
Institucionální podpora: RVO:68081731
Klíčová slova: low energy scanning electron microscopy * electron microscopy * time of flight * electron energy lost spectroscopy
Obor OECD: Electrical and electronic engineering
Trvalý link: http://hdl.handle.net/11104/0287590