Košík

0392531 - ÚJF 2014 RIV GB eng J - Článek v odborném periodiku
Platkevič, M. - Jakůbek, J. - Havránek, Vladimír - Jakůbek, M. - Pospíšil, S. - Semián, Vladimír - Žemlička, J.
Evaluation of local radiation damage in silicon sensor via charge collection mapping with the Timepix read-out chip.
Journal of Instrumentation. Roč. 8, April 2013 (2013), C04001. ISSN 1748-0221. E-ISSN 1748-0221.
[14th International Workshop on Radiation Imaging Detectors. Figueira da Foz, Coimbra, 01.07.2012-05.07.2012]
Institucionální podpora: RVO:61389005
Klíčová slova: solid state detectors * radiation damage evaluation methods * pixelated detectors and associated VLSI eletronics * radiation damage to detector materials
Kód oboru RIV: BG - Jaderná, atomová a mol. fyzika, urychlovače
Impakt faktor: 1.526, rok: 2013
http://iopscience.iop.org/1748-0221/8/04/C04001/pdf/1748-0221_8_04_C04001.pdf
Trvalý link: http://hdl.handle.net/11104/0221379