Košík

0353051 - ÚPT 2011 CN eng A - Abstrakt
Konvalina, Ivo - Hovorka, Miloš - Fořt, Tomáš - Müllerová, Ilona
Optical and scanning electron microscopies in examination of ultrathin foils.
Focus on Microscopy - FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 224.
[Focus on Microscopy - FOM 2010. 28.03.2010-31.03.2010, Shanghai]
Grant CEP: GA AV ČR IAA100650902
Výzkumný záměr: CEZ:AV0Z20650511
Klíčová slova: very low energy electrons * laser confocal microscope * free-standing ultra thin films * very low energy transmission mode
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0192399