Košík

0352430 - ÚPT 2011 SG eng A - Abstrakt
Frank, Luděk - Radlička, Tomáš - Konvalina, Ivo - Müllerová, Ilona
Very low energy scanning electron microscopy.
Eighth International Conference on Charged Particle Optics CPO-8. Singapore: National University of Singapore, 2010. s. 98-99.
[CPO /8./ International Conference on Charged Particle Optics. 12.07.2010-16.07.2010, Singapore]
Grant CEP: GA MŠMT OE08012
Výzkumný záměr: CEZ:AV0Z20650511
Klíčová slova: very low energy scanning electron microscopy * cathode lens * BSE detector
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Trvalý link: http://hdl.handle.net/11104/0191937