0487144 - FZÚ 2019 RIV NL eng J - Článek v odborném periodiku
Fait, Jan - Čermák, Jan - Stuchlík, Jiří - Rezek, Bohuslav
Complex nano-patterning of structural, optical, electrical and electron emission properties of amorphous silicon thin films by scanning probe.
Applied Surface Science. Roč. 428, Jan (2018), s. 1159-1165. ISSN 0169-4332. E-ISSN 1873-5584
Grant CEP: GA ČR GA15-01809S
Institucionální podpora: RVO:68378271
Klíčová slova: amorphous silicon * nano-templates * nanostructures * electrical conductivity * electron emission * atomic force microscopy
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 5.155, rok: 2018 ; AIS: 0.671, rok: 2018
DOI: https://doi.org/10.1016/j.apsusc.2017.09.228
Trvalý link: http://hdl.handle.net/11104/0283326