Košík

0482158 - ÚPT 2018 AT eng A - Abstrakt
Mika, Filip - Konvalina, Ivo
Application of the Bandpass Filter for Secondary Electrons in SEM.
Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. Wien: Technische Universitaet Wien, 2017. s. 72.
[SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
Grant CEP: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institucionální podpora: RVO:68081731
Klíčová slova: bandpass filter * secondary electrons * SEM
Obor OECD: Coating and films
Trvalý link: http://hdl.handle.net/11104/0277553