Košík

0475557 - ÚMCH 2018 RIV CH eng J - Článek v odborném periodiku
Todorov, V. - Lozanova, V. - Knotek, P. - Černošková, E. - Vlček, Milan
Microstructure and ellipsometric modelling of the optical properties of very thin silver films for application in plasmonics.
Thin Solid Films. Roč. 628, 30 April (2017), s. 22-30. ISSN 0040-6090. E-ISSN 1879-2731
Institucionální podpora: RVO:61389013
Klíčová slova: thin films * silver * spectral ellipsometry
Obor OECD: Inorganic and nuclear chemistry
Impakt faktor: 1.939, rok: 2017
Trvalý link: http://hdl.handle.net/11104/0274151