Počet záznamů: 1  

The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements

  1. 1.
    SYSNO ASEP0551131
    Druh ASEPA - Abstrakt
    Zařazení RIVO - Ostatní
    NázevThe time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements
    Tvůrce(i) Konvalina, Ivo (UPT-D) RID, ORCID, SAI
    Zouhar, Martin (UPT-D) ORCID, RID, SAI
    Daniel, Benjamin (UPT-D) RID
    Paták, Aleš (UPT-D) RID, ORCID, SAI
    Piňos, Jakub (UPT-D) RID, ORCID, SAI
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAI
    Zdroj.dok.Microscopy and Microanalysis. - : Cambridge University Press - ISSN 1431-9276
    Roč. 27, S1 (2021), s. 612-615
    Poč.str.4 s.
    Forma vydáníOnline - E
    Jazyk dok.eng - angličtina
    Země vyd.US - Spojené státy americké
    Klíč. slovatime of flight spectrometer ; inelastic mean free path ; energy loss spectrum ; density functional theory
    Vědní obor RIVJA - Elektronika a optoelektronika, elektrotechnika
    Obor OECDElectrical and electronic engineering
    Institucionální podporaUPT-D - RVO:68081731
    DOI10.1017/S1431927621002609
    AnotaceBoth electron microscopy and spectroscopy are powerful tools to gain information about structure and properties of various materials. We have developed a unique ultra-high vacuum instrument capable of analyzing samples via transmitted electrons in two complementary modes. These two modes are a standard microscopic regime in the range of energies from 5 keV down to few eV and a time-of-flight (ToF) method. Standard ToF spectrometers operate in energy range above 500 eV and detect reflected electrons. Our new ToF spectrometer is able to operate with energies of incident electrons below 300 eV. It detects transmitted electrons since the drift tube and detector are conveniently located below the analyzed sample. In order to apply these methods and interpret corresponding results correctly, deep understanding of electron transport phenomena in solids is required.
    PracovištěÚstav přístrojové techniky
    KontaktMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Rok sběru2022
    Elektronická adresahttps://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/timeofflight-tof-analysis-of-transmitted-electrons-at-energies-of-hundred-of-ev-for-pure-elements/13DD7110753D4BB9830773B5B732F086
Počet záznamů: 1  

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