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Low conductive thermal insulation pad with high mechanical stiffness
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SYSNO ASEP 0549376 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Low conductive thermal insulation pad with high mechanical stiffness Tvůrce(i) Hanzelka, Pavel (UPT-D) RID, ORCID, SAI
Dupák, Libor (UPT-D) RID, ORCID, SAI
Krutil, Vojtěch (UPT-D) ORCID, RID, SAI
Krzyžánek, Vladislav (UPT-D) RID, ORCID, SAI
Skoupý, Radim (UPT-D) RID, ORCID, SAI
Srnka, Aleš (UPT-D) RID, ORCID, SAI
Vlček, Ivan (UPT-D) RID, ORCID, SAI
Urban, Pavel (UPT-D) RID, ORCID, SAICelkový počet autorů 8 Zdroj.dok. International Journal of Refrigeration. - : Elsevier - ISSN 0140-7007
Roč. 132, December (2021), s. 92-99Poč.str. 8 s. Forma vydání Tištěná - P Jazyk dok. eng - angličtina Země vyd. GB - Velká Británie Klíč. slova Cryogenics ; Thermal insulation ; Microscopy ; Sample holder Vědní obor RIV BJ - Termodynamika Obor OECD Thermodynamics CEP TE01020233 GA TA ČR - Technologická agentura ČR Způsob publikování Open access Institucionální podpora UPT-D - RVO:68081731 UT WOS 000729382700010 EID SCOPUS 85120315938 DOI 10.1016/j.ijrefrig.2021.09.019 Anotace We present a low conductive thermal insulation pad named InBallPad (IBP), which we designed for placing of a sample holder of an ultra-high vacuum scanning probe microscope (UHV SPM) associated with Scanning Electron Microscopy (SEM). The microscope will operate at variable temperatures of sample holder in the range of 20 K – 700 K. IBP with diameter of 30 mm, height of 11 mm and mass of 34 g consists of a top and bottom plate made of titanium alloy which are mutually separated by specially designed low heat conductive glass ball supports. The sample holder is mounted onto the top plate whereas the bottom plate serves for mechanical connection to a piezoelectric scanner of SPM at approximately room temperature. IBP is characterized by a high lateral mechanical stiffness of 106 N/m and a low heat flow of 120 mW between the bottom and the top plate at temperatures of 290 K and 25 K, respectively. The use of the pad is not limited to the UHV SPM only, but the component is generally suitable for any devices where the sample holders work in high or ultra-high vacuum and where a wide temperature span from cryogenic to high temperatures is needed. Pracoviště Ústav přístrojové techniky Kontakt Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Rok sběru 2022 Elektronická adresa https://www.sciencedirect.com/science/article/pii/S0140700721003777?via%3Dihub
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