Počet záznamů: 1
Low-energy electron inelastic mean free path of graphene measured by a time-of-flight spectrometer
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SYSNO ASEP 0546409 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Low-energy electron inelastic mean free path of graphene measured by a time-of-flight spectrometer Tvůrce(i) Konvalina, Ivo (UPT-D) RID, ORCID, SAI
Daniel, Benjamin (UPT-D) RID
Zouhar, Martin (UPT-D) ORCID, RID, SAI
Paták, Aleš (UPT-D) RID, ORCID, SAI
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Frank, Luděk (UPT-D) RID, SAI, ORCID
Piňos, Jakub (UPT-D) RID, ORCID, SAI
Průcha, Lukáš (UPT-D) ORCID
Radlička, Tomáš (UPT-D) RID, ORCID, SAI
Werner, W. S. M. (AT)
Mikmeková, Eliška (UPT-D) RIDCelkový počet autorů 11 Číslo článku 2435 Zdroj.dok. Nanomaterials. - : MDPI
Roč. 11, č. 9 (2021)Poč.str. 18 s. Forma vydání Online - E Jazyk dok. eng - angličtina Země vyd. CH - Švýcarsko Klíč. slova time-of-flight spectrometer ; inelastic mean free path ; density-functional theory ; many-body perturbation theory ; energy-loss spectrum ; density of states ; band structure ; graphene Vědní obor RIV JA - Elektronika a optoelektronika, elektrotechnika Obor OECD Electrical and electronic engineering CEP TN01000008 GA TA ČR - Technologická agentura ČR Způsob publikování Open access Institucionální podpora UPT-D - RVO:68081731 UT WOS 000700533400001 EID SCOPUS 85115084803 DOI 10.3390/nano11092435 Anotace The detailed examination of electron scattering in solids is of crucial importance for the theory of solid-state physics, as well as for the development and diagnostics of novel materials, particularly those for micro- and nanoelectronics. Among others, an important parameter of electron scattering is the inelastic mean free path (IMFP) of electrons both in bulk materials and in thin films, including 2D crystals. The amount of IMFP data available is still not sufficient, especially for very slow electrons and for 2D crystals. This situation motivated the present study, which summarizes pilot experiments for graphene on a new device intended to acquire electron energy-loss spectra (EELS) for low landing energies. Thanks to its unique properties, such as electrical conductivity and transparency, graphene is an ideal candidate for study at very low energies in the transmission mode of an electron microscope. The EELS are acquired by means of the very low-energy electron microspectroscopy of 2D crystals, using a dedicated ultra-high vacuum scanning low-energy electron microscope equipped with a time-of-flight (ToF) velocity analyzer. In order to verify our pilot results, we also simulate the EELS by means of density functional theory (DFT) and the many-body perturbation theory. Additional DFT calculations, providing both the total density of states and the band structure, illustrate the graphene loss features. We utilize the experimental EELS data to derive IMFP values using the so-called log-ratio method. Pracoviště Ústav přístrojové techniky Kontakt Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Rok sběru 2022 Elektronická adresa https://www.mdpi.com/2079-4991/11/9/2435
Počet záznamů: 1