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Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation
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SYSNO ASEP 0539468 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation Tvůrce(i) Mikšová, Romana (UJF-V) RID, ORCID, SAI
Jagerová, Adéla (UJF-V) ORCID, SAI
Malinský, Petr (UJF-V) RID, ORCID, SAI
Harcuba, P. (CZ)
Veselý, J. (CZ)
Holý, V. (CZ)
Kentsch, U. (DE)
Macková, Anna (UJF-V) RID, ORCID, SAICelkový počet autorů 8 Číslo článku 109773 Zdroj.dok. Vacuum. - : Elsevier - ISSN 0042-207X
Roč. 184, FEB (2021)Poč.str. 11 s. Forma vydání Tištěná - P Jazyk dok. eng - angličtina Země vyd. GB - Velká Británie Klíč. slova Ag-ion implantation ; Yttria-stabilised zirconia ; damage accumulation ; strain relaxation ; nanoparticles Vědní obor RIV BG - Jaderná, atomová a mol. fyzika, urychlovače Obor OECD Materials engineering CEP LM2015056 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy GA18-03346S GA ČR - Grantová agentura ČR Způsob publikování Omezený přístup Institucionální podpora UJF-V - RVO:61389005 UT WOS 000604850800002 EID SCOPUS 85091829122 DOI https://doi.org/10.1016/j.vacuum.2020.109773 Anotace The paper reports on implantation damage accumulation, Ag distribution and the interior morphology in different crystallographic orientations of implanted samples of cubic yttria-stabilised zirconia (YSZ). (100)-, (110)- and (111)-oriented YSZ was implanted with 400-keV Ag+ ions at ion fluences from 5 x 10(14) to 5 x 10(16) cm(-2). Rutherford backscattering spectrometry (RBS) in the channelling mode (RBS-C), as well as X-ray diffraction (XRD), were used for the quantitative measurement of the lattice disorder and Ag distribution. The defect propagation and Ag accumulation were observed using transmission electron microscopy (TEM) with the energy-dispersive X-ray spectroscopy (EDX). Although similar damage evolution trends were observed along with all channelling directions, the disorder accumulation is lower along the 110 direction than along the 100 and 111 direction. The damage extends much deeper than the theoretically predicted depths. It is attributed to long-range defect migration effects, confirmed by TEM. At the ion fluence of 5 x 10(16) cm(-2), nanometre-sized Ag precipitates were identified in the depth of 30-130 nm based on the Ag concentration-depth profiles determined by RBS. Pracoviště Ústav jaderné fyziky Kontakt Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Rok sběru 2022 Elektronická adresa https://doi.org/10.1016/j.vacuum.2020.109773
Počet záznamů: 1