Počet záznamů: 1  

Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation

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    SYSNO ASEP0539468
    Druh ASEPJ - Článek v odborném periodiku
    Zařazení RIVJ - Článek v odborném periodiku
    Poddruh JČlánek ve WOS
    NázevMulti-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation
    Tvůrce(i) Mikšová, Romana (UJF-V) RID, ORCID
    Jagerová, Adéla (UJF-V) ORCID
    Malinský, Petr (UJF-V) RID, ORCID
    Harcuba, P. (CZ)
    Veselý, J. (CZ)
    Holý, V. (CZ)
    Kentsch, U. (DE)
    Macková, Anna (UJF-V) RID, ORCID
    Celkový počet autorů8
    Číslo článku109773
    Zdroj.dok.Vacuum. - : Elsevier - ISSN 0042-207X
    Roč. 184, FEB (2021)
    Poč.str.11 s.
    Forma vydáníTištěná - P
    Jazyk dok.eng - angličtina
    Země vyd.GB - Velká Británie
    Klíč. slovaAg-ion implantation ; Yttria-stabilised zirconia ; damage accumulation ; strain relaxation ; nanoparticles
    Vědní obor RIVBG - Jaderná, atomová a mol. fyzika, urychlovače
    Obor OECDMaterials engineering
    CEPLM2015056 GA MŠk - Ministerstvo školství, mládeže a tělovýchovy
    GA18-03346S GA ČR - Grantová agentura ČR
    Způsob publikováníOmezený přístup
    Institucionální podporaUJF-V - RVO:61389005
    UT WOS000604850800002
    EID SCOPUS85091829122
    DOI10.1016/j.vacuum.2020.109773
    AnotaceThe paper reports on implantation damage accumulation, Ag distribution and the interior morphology in different crystallographic orientations of implanted samples of cubic yttria-stabilised zirconia (YSZ). (100)-, (110)- and (111)-oriented YSZ was implanted with 400-keV Ag+ ions at ion fluences from 5 x 10(14) to 5 x 10(16) cm(-2). Rutherford backscattering spectrometry (RBS) in the channelling mode (RBS-C), as well as X-ray diffraction (XRD), were used for the quantitative measurement of the lattice disorder and Ag distribution. The defect propagation and Ag accumulation were observed using transmission electron microscopy (TEM) with the energy-dispersive X-ray spectroscopy (EDX). Although similar damage evolution trends were observed along with all channelling directions, the disorder accumulation is lower along the 110 direction than along the 100 and 111 direction. The damage extends much deeper than the theoretically predicted depths. It is attributed to long-range defect migration effects, confirmed by TEM. At the ion fluence of 5 x 10(16) cm(-2), nanometre-sized Ag precipitates were identified in the depth of 30-130 nm based on the Ag concentration-depth profiles determined by RBS.
    PracovištěÚstav jaderné fyziky
    KontaktMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Rok sběru2022
    Elektronická adresahttps://doi.org/10.1016/j.vacuum.2020.109773
Počet záznamů: 1