Počet záznamů: 1

Microcapacitors on graphene oxide and synthetic polymers prepared by microbeam lithography

SYSNO ASEP	0534240
Druh ASEP	J - Článek v odborném periodiku
Zařazení RIV	J - Článek v odborném periodiku
Poddruh J	Článek ve WOS
Název	Microcapacitors on graphene oxide and synthetic polymers prepared by microbeam lithography
Tvůrce(i)	Malinský, Petr (UJF-V)_{RID, ORCID, SAI} Romanenko, Oleksandr V. (UJF-V)_{ORCID, SAI} Havránek, Vladimír (UJF-V)_{RID, SAI, ORCID} Stammers, James H. (UJF-V) Hnatowicz, Vladimír (UJF-V)_RID Cutroneo, Mariapompea (UJF-V)_{ORCID, RID, SAI} Novák, Josef (UJF-V)_ORCID Slepička, P. (CZ) Svorčík, V. (CZ) Szokolova, K. (CZ) Bouša, D. (CZ) Sofer, Z. (CZ) Macková, Anna (UJF-V)_{RID, ORCID, SAI}
Celkový počet autorů	13
Číslo článku	146802
Zdroj.dok.	Applied Surface Science. - : Elsevier - ISSN 0169-4332 Roč. 528, OCT (2020)
Poč.str.	11 s.
Forma vydání	Tištěná - P
Jazyk dok.	eng - angličtina
Země vyd.	NL - Nizozemsko
Klíč. slova	Polymers ; Graphene oxide ; ion-beam writing ; chemical properties ; microcapacitors
Vědní obor RIV	JJ - Ostatní materiály
Obor OECD	Coating and films
CEP	GA19-02482S GA ČR - Grantová agentura ČR
	EF16_013/0001812 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy
Způsob publikování	Omezený přístup
Institucionální podpora	UJF-V - RVO:61389005
UT WOS	000576739600009
EID SCOPUS	85086823551
DOI	10.1016/j.apsusc.2020.146802
Anotace	Carbon-ion microbeam writing was employed for the mask-less production of microscale capacitors in insulating graphene oxide (GO), polyimide (PI) and poly(methyl-methacrylate) (PMMA) foils. The substrates were irradiated by a 5 MeV C beams with micrometer-scale resolution to create conducive strips. The morphology and quality of the created microstructures and compositional changes in the host matrix under the ion microbeam irradiation were studied using scanning electron microscopy and energy-dispersive X-ray spectroscopy. The changes in the structure and elemental composition of the irradiated areas were characterised by Raman microspectroscopy, X-ray photoelectron spectroscopy, Rutherford backscattering spectroscopy and elastic recoil detection analysis. The microcapacitors with the highest capacitance (in the order of pF) were those prepared on the GO surface. On the other hand, in PI and PMMA, the same carbon-ion irradiation does not induce such a significant enhancement of electric properties and the capacity of the resulting capacitor-like structures is substantially lower.
Pracoviště	Ústav jaderné fyziky
Kontakt	Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
Rok sběru	2021
Elektronická adresa	https://doi.org/10.1016/j.apsusc.2020.146802

Počet záznamů: 1