Počet záznamů: 1
Scanning tunneling microscopy in the field-emission regime: Formation of a two-dimensional electron cascade
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SYSNO ASEP 0522074 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Scanning tunneling microscopy in the field-emission regime: Formation of a two-dimensional electron cascade Tvůrce(i) Werner, W. S. M. (AT)
Oral, Martin (UPT-D) RID, ORCID, SAI
Radlička, Tomáš (UPT-D) RID, ORCID, SAI
Zelinka, Jiří (UPT-D) RID, SAI
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Bellissimo, A. (CH)
Bertolini, G. (CH)
Cabrera, H. (CH)
Gurlu, O. (TR)Celkový počet autorů 9 Číslo článku 251604 Zdroj.dok. Applied Physics Letters. - : AIP Publishing - ISSN 0003-6951
Roč. 115, č. 25 (2019)Poč.str. 5 s. Forma vydání Tištěná - P Jazyk dok. eng - angličtina Země vyd. US - Spojené státy americké Klíč. slova spin polarization ; diffraction Vědní obor RIV JA - Elektronika a optoelektronika, elektrotechnika Obor OECD Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect) Způsob publikování Omezený přístup Institucionální podpora UPT-D - RVO:68081731 UT WOS 000505535900034 EID SCOPUS 85076813179 DOI 10.1063/1.5128300 Anotace The signal generation mechanism of the scanning field-emission microscope has been investigated via model calculations combining deterministic trajectory calculations in the field surrounding the field-emission tip in vacuum, with Monte Carlo simulations of the electron transport inside the solid. This model gives rise to a two-dimensional electron cascade. Individual trajectories of detected backscattered electrons consist of repeated segments of travel in vacuum followed by a re-entry into the solid and re-emission into vacuum after being elastically or inelastically scattered. These so-called electron bouncing events also create secondary electrons at macroscopic distances away from the primary impact position. The signal reaching the detector is made up of elastically and inelastically backscattered primary electrons created near the impact position under the tip and those secondary electrons created far away from it. Pracoviště Ústav přístrojové techniky Kontakt Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Rok sběru 2020 Elektronická adresa https://aip.scitation.org/doi/10.1063/1.5128300
Počet záznamů: 1