Počet záznamů: 1
Structural and compositional modification of graphene oxide by means of medium and heavy ion implantation
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SYSNO ASEP 0520686 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Structural and compositional modification of graphene oxide by means of medium and heavy ion implantation Tvůrce(i) Malinský, Petr (UJF-V) RID, ORCID, SAI
Cutroneo, Mariapompea (UJF-V) ORCID, RID, SAI
Sofer, Z. (CZ)
Szokolova, K. (CZ)
Bottger, R. (DE)
Akhmadaliev, S. (DE)
Macková, Anna (UJF-V) RID, ORCID, SAICelkový počet autorů 7 Zdroj.dok. Nuclear Instruments & Methods in Physics Research Section B. - : Elsevier - ISSN 0168-583X
Roč. 460, č. 12 (2019), s. 201-208Poč.str. 8 s. Forma vydání Tištěná - P Akce 28th International Conference on Atomic Collisions in Solids (ICACS) / 10th International Symposium on Swift Heavy Ions in Matter (SHIM) Datum konání 01.07.2018 - 07.07.2018 Místo konání Caen Země FR - Francie Typ akce WRD Jazyk dok. eng - angličtina Země vyd. NL - Nizozemsko Klíč. slova chemical properties ; electrical properties ; graphene oxide ; ion irradiation Vědní obor RIV BG - Jaderná, atomová a mol. fyzika, urychlovače Obor OECD Nuclear related engineering CEP LM2015056 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy GA16-05167S GA ČR - Grantová agentura ČR EF16_013/0001812 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy Způsob publikování Omezený přístup Institucionální podpora UJF-V - RVO:61389005 UT WOS 000504510900038 EID SCOPUS 85063099323 DOI 10.1016/j.nimb.2019.03.022 Anotace The ion irradiation fluences of 5.0 x 10(14) cm(-2), 5.0 x 10(15) cm(-2) and 5.0 x 10(16) cm(-2) were used. Upon irradiation, the modified GO foils were characterised using nuclear analytical methods Rutherford Backscattering Spectrometry (RBS), Elastic Recoil Detection Analysis (ERDA) and various conventional analytical methods such as Raman spectroscopy, Attenuated Total Reflectance Fourier Transform Infrared Spectroscopy (ATR-FTIR), X-ray Photoelectron Spectroscopy (XPS), and 2-point conductivity measurements. Oxygen species removal was evidenced as the increasing function of the ion implantation fluence and oxygen depth profiles exhibited complex behaviour connected to implanted ion specie. The deep oxygen depletion in the broad surface layer accompanied by Ga diffusion into the depth was observed in Ga irradiated GO compared to Au irradiated samples which exhibited a narrow oxygen depleted layer at GO surface. XPS evidenced strong increase of C=C bonds compared to C-O bonds on the irradiated GO surface with increasing ion fluence, which was comparable for both ion species. Raman spectroscopy shows the modification of main phonon modes identified in GO. The D peak slight decrease and broadening was observed for GO irradiated with ion fluence above 5 x 1015 cm(-2) and mainly for Au ion irradiation. FTIR analysis proved the oxygen containing functional group release with the increased ion fluence, mainly C-O group release after Au ion irradiation was observed. Simultaneously H-O stretching absorption peak is in FTIR spectrum reduced more significantly for Ga irradiated GO which is in accordance with RBS elemental analysis exhibiting the more pronounced hydrogen depletion. Electrical conductivity measurement shows the linear I-V characteristics for the GO irradiated using both ion species and all ion fluences, the surface layer exhibited conductive behaviour comparing to pristine GO non-linear I-V characteristics. Pracoviště Ústav jaderné fyziky Kontakt Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Rok sběru 2020 Elektronická adresa https://doi.org/10.1016/j.nimb.2019.03.022
Počet záznamů: 1