Počet záznamů: 1

Correlative Raman-SEM imaging of sp2-sp3 hybridized carbon heterostructures

SYSNO ASEP	0486983
Druh ASEP	A - Abstrakt
Zařazení RIV	O - Ostatní
Název	Correlative Raman-SEM imaging of sp2-sp3 hybridized carbon heterostructures
Tvůrce(i)	Varga, Marián (FZU-D)_{RID, ORCID} Vretenár, V. (SK) Váňa, R. (CZ) Potocký, Štěpán (FZU-D)_{RID, ORCID} Kromka, Alexander (FZU-D)_{RID, ORCID, SAI}
Celkový počet autorů	5
Zdroj.dok.	2nd International Conference on Applied Surface Science (ICASS). - Dalian, 2017 / Rudolph H. - ISSN 0169-4332
Poč.str.	1 s.
Forma vydání	Online - E
Akce	International Conference on Applied Surface Science (ICASS) /2./
Datum konání	12.06.2017 - 15.06.2017
Místo konání	Dalian
Země	CN - Čína
Typ akce	WRD
Jazyk dok.	eng - angličtina
Země vyd.	CN - Čína
Klíč. slova	RISE microscopy ; Raman ; carbon
Vědní obor RIV	BM - Fyzika pevných látek a magnetismus
Obor OECD	Condensed matter physics (including formerly solid state physics, supercond.)
CEP	GC15-22102J GA ČR - Grantová agentura ČR
Institucionální podpora	FZU-D - RVO:68378271
Anotace	We present RISE microscopy of sp2-sp3 hybridized carbon heterostructures. We study a composite of single-wall carbon nanotubes decorated with DNPs and a SWCNT paper overgrown with nanocrystalline diamond. The Raman measurements reveal a complex spectrum consisting from characteristic peaks/bands of both carbon phases. The overlaid SEM image with color-coded Raman map link structural surface properties of the heterostructure with the molecular compound information. That allows an easier and clearer interpretation and understanding of Raman spectra features, shift of the individual peaks and determination of the dominant carbon phase within the sp2-sp3 heterostructure. We found and in-situ confirmed by Raman measurements a structural degradation of samples after electron beam irradiation at higher voltages. It should be noted that Raman laser irradiation at higher powers degraded the sample too, as evidenced in altered Raman spectra and surface features by correlative RISE microscopy.
Pracoviště	Fyzikální ústav
Kontakt	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Rok sběru	2018
Elektronická adresa	https://www.elsevier.com/events/conferences/international-conference-on-applied-surface-science/programme

Počet záznamů: 1