Počet záznamů: 1
X-ray analysis of fully depleted CCDs with small pixel size
- 1.
SYSNO ASEP 0485070 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název X-ray analysis of fully depleted CCDs with small pixel size Tvůrce(i) Kotov, I.V. (US)
Haupt, J. (US)
Kubánek, Petr (FZU-D) RID
O'Connor, P. (US)
Takacs, P. (US)Celkový počet autorů 5 Zdroj.dok. Nuclear Instruments & Methods in Physics Research Section A. - : Elsevier - ISSN 0168-9002
Roč. 787, Jul (2015), s. 12-19Poč.str. 8 s. Jazyk dok. eng - angličtina Země vyd. NL - Nizozemsko Klíč. slova charge diffusion ; Charge transfer efficiency ; CTE ; CCD Vědní obor RIV BN - Astronomie a nebeská mechanika, astrofyzika Obor OECD Astronomy (including astrophysics,space science) Institucionální podpora FZU-D - RVO:68378271 UT WOS 000354869900004 EID SCOPUS 84939934922 DOI 10.1016//j.nima.2014.10.027 Anotace X-ray frames offer a lot of information about CCD. sources are traditionally being used for CCD gain and charge transfer efficiency (CTE) measurements. We demonstrate how spectral lines of 55Fe and 241Am rad. sources are used for system linearity measurements. The pixel size of modern scientific CCDs is getting smaller. The charge diffusion causes the charge spread among neighboring pixels especially in thick fully depleted sensors. This enables measurement of the charge diffusion using 55Fe X-rays. On the other hand, the usual CTE characterization method based on single pixel X-ray events becomes statistically deficient. A new way of measuring CTE using shape and amplitude analysis of X-ray clusters is presented and discussed. The lateral diffusion measured using e2v CCD250 is presented and implications for X-ray cluster size and expected cluster shape are discussed. The CTE analysis using total X-ray cluster amplitude is presented.
Pracoviště Fyzikální ústav Kontakt Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Rok sběru 2018
Počet záznamů: 1