Počet záznamů: 1
Identification of microscopic domain wall motion from temperature dependence of nonlinear dielectric response.
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SYSNO ASEP 0479363 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Identification of microscopic domain wall motion from temperature dependence of nonlinear dielectric response. Tvůrce(i) Mokrý, Pavel (UFP-V) RID
Sluka, T. (CH)Číslo článku 162906 Zdroj.dok. Applied Physics Letters. - : AIP Publishing - ISSN 0003-6951
Roč. 110, č. 16 (2017)Poč.str. 4 s. Forma vydání Tištěná - P Jazyk dok. eng - angličtina Země vyd. US - Spojené státy americké Klíč. slova microscopic domain wall ; electric fields ; temperature dependence Vědní obor RIV JA - Elektronika a optoelektronika, elektrotechnika Obor OECD Electrical and electronic engineering CEP GA14-32228S GA ČR - Grantová agentura ČR Institucionální podpora UFP-V - RVO:61389021 UT WOS 000399984200045 EID SCOPUS 85018500581 DOI 10.1063/1.4981874 Anotace It is known that the permittivity of ferroelectric polydomain films and single crystals in weak electric fields is strongly enhanced by the reversible movement of pinned domain walls. Two mechanisms of the movement exist: first, the bending of free segments of the domain wall and second the planar movement of the domain wall as a whole. In this work, we theoretically demonstrate that it is possible to determine the dominant mechanism of the reversible domain wall movement by means of a temperature measurement of a nonlinear macroscopic dielectric response. In addition, we demonstrate that using this approach, it is possible to obtain quantitative information on the microscopic distribution of the pinning centers. Thus, we suggest that this concept may serve as a simple and useful characterisation tool in the process of development of high-permittivity materials. Pracoviště Ústav fyziky plazmatu Kontakt Vladimíra Kebza, kebza@ipp.cas.cz, Tel.: 266 052 975 Rok sběru 2018
Počet záznamů: 1