Počet záznamů: 1
Beam damage of embedding media sections and their investigations by SEM
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SYSNO ASEP 0436824 Druh ASEP C - Konferenční příspěvek (mezinárodní konf.) Zařazení RIV D - Článek ve sborníku Název Beam damage of embedding media sections and their investigations by SEM Tvůrce(i) Krzyžánek, Vladislav (UPT-D) RID, ORCID, SAI
Novotná, V. (CZ)
Hrubanová, Kamila (UPT-D) RID, SAI, ORCID
Nebesářová, J. (CZ)Celkový počet autorů 4 Zdroj.dok. 18th International Microscopy Congres. Proceedings. - Praha : Czechoslovak Microscopy Society, 2014 - ISBN 978-80-260-6720-7 Poč.str. 2 s. Forma vydání Online - E Akce International Microscopy Congres /18./ Datum konání 07.09.2014-12.09.2014 Místo konání Praha Země CZ - Česká republika Typ akce WRD Jazyk dok. eng - angličtina Země vyd. CZ - Česká republika Klíč. slova beam damage ; mass determination ; ADF imaging Vědní obor RIV JB - Senzory, čidla, měření a regulace CEP TE01020118 GA TA ČR - Technologická agentura ČR GA14-20012S GA ČR - Grantová agentura ČR Institucionální podpora UPT-D - RVO:68081731 Anotace A scanning transmission electron microscope (STEM) is useful device combining features of scanning and transmission electron microscopes. The sample in form of the ultrathin section is scanned by the electron probe and the transmitted electrons are detected. Except the dedicated STEMs this mode can exist as options in both TEM and SEM. The STEM based on the SEM equipped by a transmission detector was used for presented experiments. Nowadays, such low voltage STEM is more often used, and in many cases replaces the typical TEM. Here, we report investigations of embedding media that are typically used for TEM preparation of biological samples. The STEM detector in SEM may be able to detect both bright-field and dark-fields images. It uses much lower acceleration voltages (30 kV and below) than conventional TEM or STEM. However, materials like biological samples, polymers including embedding media are electron beam sensitive. Two the most important beam damages are the mass loss and the contamination. Both types of damages depend on the used electron energy and the electron dose applied to the sample. The mass loss depends on the sample composition, and the contamination results from the poor vacuum in the specimen chamber of the SEM, cleanness of the sample surface, etc. Pracoviště Ústav přístrojové techniky Kontakt Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Rok sběru 2015
Počet záznamů: 1