Počet záznamů: 1  

Atomic Force Microscopy Investigations into Biology - From Cell to Protein

  1. 1.
    SYSNO ASEP0390150
    Druh ASEPM - Kapitola v monografii
    Zařazení RIVC - Kapitola v knize
    NázevArtifacts in atomic force microscopy of biological samples
    Tvůrce(i) Ukraintsev, Egor (FZU-D) RID, ORCID
    Kromka, Alexander (FZU-D) RID, ORCID, SAI
    Kozak, Halyna (FZU-D) RID, ORCID
    Remeš, Zdeněk (FZU-D) RID, ORCID
    Rezek, Bohuslav (FZU-D) RID, ORCID
    Zdroj.dok.Atomic Force Microscopy Investigations into Biology - From Cell to Protein. - Rijeka : InTech, 2012 / Frewin C.L. - ISBN 978-953-51-0114-7
    Rozsah strans. 29-54
    Poč.str.26 s.
    Poč.str.knihy354
    Forma vydáníTištěná - P
    Jazyk dok.eng - angličtina
    Země vyd.HR - Chorvatsko
    Klíč. slovaatomic force microscopy (AFM) ; validity of measurement ; accuracy of measurement
    Vědní obor RIVBM - Fyzika pevných látek a magnetismus
    CEPLC06040 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy
    KAN400100701 GA AV ČR - Akademie věd
    LC510 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy
    CEZAV0Z10100521 - FZU-D (2005-2011)
    DOI10.5772/2092
    AnotaceAtomic force microscopy (AFM) is a frequently used method applicable also to biological studies due to its capability of measuring in native environment. However, AFM images often contain features which are not present on the sample in reality, but are a direct result of the measurements itself. Such structures or features are denoted as artifacts. The artifacts arise from various reasons. Some of them can be avoided during measurements, other ones are inherent. The artifacts shown in this chapter are divided into several categories based on the part of AFM which is responsible for them. Examples of many artifacts are presented and their reasons are explained. This chapter will be helpful for AFM users who observe strange effects, presumably related to the AFM technique, but do not know their reason. This chapter can also answer questions about the validity of imaged features as well as their accuracy.
    PracovištěFyzikální ústav
    KontaktKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Rok sběru2013
Počet záznamů: 1  

  Tyto stránky využívají soubory cookies, které usnadňují jejich prohlížení. Další informace o tom jak používáme cookies.