Standing Wave Interferometer with Stabilization of Wavelength on Air

Lazar, Josef; Číp, Ondřej; Čížek, Martin; Hrabina, Jan; Buchta, Zdeněk

doi:https://dx.doi.org/10.1524/teme.2011.0201

Počet záznamů: 1

Standing Wave Interferometer with Stabilization of Wavelength on Air

1.

SYSNO ASEP	0368388
Druh ASEP	J - Článek v odborném periodiku
Zařazení RIV	J - Článek v odborném periodiku
Poddruh J	Článek ve WOS
Název	Standing Wave Interferometer with Stabilization of Wavelength on Air
Tvůrce(i)	Lazar, Josef (UPT-D)_{RID, ORCID, SAI} Číp, Ondřej (UPT-D)_{RID, SAI, ORCID} Čížek, Martin (UPT-D)_{RID, ORCID, SAI} Hrabina, Jan (UPT-D)_{RID, ORCID, SAI} Buchta, Zdeněk (UPT-D)_{RID, SAI, ORCID}
Celkový počet autorů	5
Zdroj.dok.	tm-Technisches Messen - ISSN 0171-8096 Roč. 78, č. 11 (2011), s. 484-488
Poč.str.	5 s.
Jazyk dok.	eng - angličtina
Země vyd.	DE - Německo
Klíč. slova	refractometry ; nanopositioning ; interferometry ; nanometrology
Vědní obor RIV	BH - Optika, masery a lasery
CEP	GA102/09/1276 GA ČR - Grantová agentura ČR
	GPP102/11/P820 GA ČR - Grantová agentura ČR
	KAN311610701 GA AV ČR - Akademie věd
	LC06007 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy
CEZ	AV0Z20650511 - UPT-D (2005-2011)
UT WOS	000297711400002
EID SCOPUS	80055095667
DOI	10.1524/teme.2011.0201
Anotace	We present an experimental arrangement of an interferometric system designed to operate with full compensation for varying refractive index of air in the measuring axis. The concept is based on a principle where the wavelength of the laser source is derived not from an optical frequency of the stabilized laser but from a fixed length being a base-plate or a frame of the whole measuring setup. This results into stabilization of the wavelength of the laser source in atmospheric conditions to mechanical length of suitable etalon made of a material with very low thermal expansion. The ultra-low thermal expanding glass ceramic materials available on the market perform thermal expansion coefficients on the level 10-8 which significantly exceeds the limits of uncertainty posed by indirect evaluation of refractive index of air through Edlen formula. This approach represents a contribution primarily to high-resolution and high-precision dimensional metrology in the nanoscale.
Pracoviště	Ústav přístrojové techniky
Kontakt	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Rok sběru	2012

Počet záznamů: 1