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Transmission electron microscopy study of microstructural evolution in nanograined Ni-Ti microwires heat treated by electric pulse
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SYSNO ASEP 0365169 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Transmission electron microscopy study of microstructural evolution in nanograined Ni-Ti microwires heat treated by electric pulse Tvůrce(i) Delville, R. (BE)
Malard, B. (FR)
Pilch, Jan (FZU-D) RID
Šittner, Petr (FZU-D) RID, ORCID
Schryvers, D. (BE)Zdroj.dok. Solid State Phenomena - ISSN 1012-0394
172-174, č. 6 (2011), s. 682-687Poč.str. 6 s. Jazyk dok. eng - angličtina Země vyd. CH - Švýcarsko Klíč. slova transmission electron microscopy ; shape memory alloy ; martensitic transformation ; dislocation slip ; nanograins Vědní obor RIV BM - Fyzika pevných látek a magnetismus CEP LA10010 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy CEZ AV0Z10100520 - FZU-D (2005-2011) UT WOS 000303359700105 DOI 10.4028/www.scientific.net/SSP.172-174.682 Anotace Transmission electron microscopy and mechanical testing were employed to investigate the evolution of microstructure and functional superelastic properties of 0.1mm diameter as-drawn Ni-Ti wires subjected to a non-conventional heat treatment by controlled electric pulse current. This method enables a finer control of the recovery and recrystallisation processes taking place during the heat treatment and accordingly a better control on the final microstructure. The best functional properties were obtained for heat-treated Ni-Ti wires having a nanograined microstructure (20-50 nm) partially recovered through polygonization and partially recrystallized. Such microstructure is highly resistant against dislocation slip upon cycling, while microstructures annealed for longer time and showing mostly recrystallized grains were prone to dislocation slip, particularly as the grain size exceeds 100 nm. Pracoviště Fyzikální ústav Kontakt Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Rok sběru 2012
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