Počet záznamů: 1
Ambient analysis of trace compounds in gaseous media by SIFT-MS
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SYSNO ASEP 0359555 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Ambient analysis of trace compounds in gaseous media by SIFT-MS Tvůrce(i) Smith, D. (GB)
Španěl, Patrik (UFCH-W) RID, ORCIDZdroj.dok. Analyst. - : Royal Society of Chemistry - ISSN 0003-2654
Roč. 136, č. 10 (2011), s. 2009-2032Poč.str. 24 s. Jazyk dok. eng - angličtina Země vyd. GB - Velká Británie Klíč. slova ion-flow tube ; mass spectrometry ; SIFT-MS Vědní obor RIV CF - Fyzikální chemie a teoretická chemie CEP GA202/09/0800 GA ČR - Grantová agentura ČR GA203/09/0256 GA ČR - Grantová agentura ČR CEZ AV0Z40400503 - UFCH-W (2005-2011) UT WOS 000289896000001 DOI 10.1039/c1an15082k Anotace The topic of ambient gas analysis has been rapidly developed in the last few years with the evolution of the exciting new techniques such as DESI, DART and EESI. The essential feature of all is that analysis of trace gases can be accomplished either in the gas phase or those released from surfaces, crucially avoiding sample collection or modification. In this regard, selected ion flow tube mass spectrometry, SIFT-MS, also performs ambient analyses both accurately and rapidly. In this focused review we describe the underlying ion chemistry underpinning SIFT-MS through a discourse on the reactions of different classes of organic and inorganic molecules with H3O+, NO+ and O-2(+center dot) studied using the SIFT technique. Rate coefficients and ion products of these reactions facilitate absolute SIFT-MS analyses and can also be useful for the interpretation of data obtained by the other ambient analysis methods mentioned above. Pracoviště Ústav fyzikální chemie J.Heyrovského Kontakt Michaela Knapová, michaela.knapova@jh-inst.cas.cz, Tel.: 266 053 196 Rok sběru 2012
Počet záznamů: 1