Počet záznamů: 1
Effects of Ni+ ion implantation and post annealing in PEEK, PET and PI: the morphology, the microstructure and the electric properties
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SYSNO ASEP 0351882 Druh ASEP A - Abstrakt Zařazení RIV Záznam nebyl označen do RIV Zařazení RIV Není vybrán druh dokumentu Název Effects of Ni+ ion implantation and post annealing in PEEK, PET and PI: the morphology, the microstructure and the electric properties Tvůrce(i) Macková, Anna (UJF-V) RID, ORCID, SAI
Malinský, Petr (UJF-V) RID, ORCID, SAI
Hnatowicz, Vladimír (UJF-V) RID
Khaibullin, R. I. (RU)
Slepička, P. (CZ)
Švorčík, V. (CZ)
Šlouf, Miroslav (UMCH-V) RID, ORCID
Peřina, Vratislav (UJF-V) RIDCelkový počet autorů 8 Zdroj.dok. 17th International conference on ion beam modification of materials, book of abstracts, P2-4-146. - 2010
Roč. 2010 (2010), s. 127-127Poč.str. 1 s. Akce 17th international conference on ion beam modification of materials Datum konání 22.08.2010-27.08.2010 Místo konání Montreal Země CA - Kanada Typ akce WRD Jazyk dok. eng - angličtina Země vyd. CA - Kanada Klíč. slova Ni ion implantation ; polymers ; depth profiles ; RBS ; TEM ; AFM Vědní obor RIV BM - Fyzika pevných látek a magnetismus CEP KAN400480701 GA AV ČR - Akademie věd GA106/09/0125 GA ČR - Grantová agentura ČR CEZ AV0Z10480505 - UJF-V (2005-2011) AV0Z40500505 - UMCH-V (2005-2011) Anotace Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni+ ions at RT to the fluences (0.25-1.5)x1017 cm-2 at ion current density of 4 μA.cm-2. Then some of the samples were annealed at the temperatures close tothe glassy transition temperature. Depth profiles of the Ni atoms in the as implanted and annealed samples were determined by RBS method. The profiles in the as implanted samples agree well with those calculated using TRIDYN code. The implanted Ni atoms tend to aggregate into nano-particles, the size and distribution of which was determined from TEM images. The nano-particle size increases with increasing ion fluence. Subsequent annealing leads to a reduction in the nanoparticle size. The surface morphology of the implanted and annealed samples was studied using AFM. Pracoviště Ústav jaderné fyziky Kontakt Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Rok sběru 2011
Počet záznamů: 1