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Organized Mesoporous TiO2 Films Stabilized by Phosphorus: Application for Dye-Sensitized Solar Cells
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SYSNO ASEP 0331908 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Organized Mesoporous TiO2 Films Stabilized by Phosphorus: Application for Dye-Sensitized Solar Cells Tvůrce(i) Zukalová, Markéta (UFCH-W) RID, SAI, ORCID
Procházka, Jan (UFCH-W)
Zukal, Arnošt (UFCH-W) RID
Yum, J. H. (CH)
Kavan, Ladislav (UFCH-W) RID, ORCID
Graetzel, M. (CH)Zdroj.dok. Journal of the Electrochemical Society. - : Electrochemical Society - ISSN 0013-4651
Roč. 157, č. 1 (2010), H99-H103Poč.str. 5 s. Jazyk dok. eng - angličtina Země vyd. US - Spojené státy americké Klíč. slova annealing ; anodes ; mesoporous materials ; dyes Vědní obor RIV CG - Elektrochemie CEP LC510 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy OC09048 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy IAA400400804 GA AV ČR - Akademie věd KAN200100801 GA AV ČR - Akademie věd KAN100500652 GA AV ČR - Akademie věd CEZ AV0Z40400503 - UFCH-W (2005-2011) UT WOS 000272387200094 DOI https://doi.org/10.1149/1.3250958 Anotace A synthetic protocol was developed for the preparation of thin mesoporous TiO2 films with enhanced thermal stability. This objective was achieved by a modification of the procedure of supramolecular templating by a Pluronic P-123 copolymer by an addition of a small amount of phosphoric acid to the precursor solution. Thin mesoporous TiO2 films up to 2.3 µm thick were prepared via layer-by-layer deposition. The roughness factor exceeding 1300 was achieved on these films. After annealing at 540°C, well-developed 5–6 nm anatase nanocrystals were present in the pore walls of a still perfect mesoporous structure. The pore coalescence and structure collapse during heat-treatment were effectively hindered by the presence of phosphorus. Our P-modified mesoporous TiO2 films were sensitized with the N-945 dye and used as photoanodes of the dye-sensitized solar cells. They reached the conversion efficiency of 5.03 or 5.05% for the film thickness of 1.8 or 2.3 µm, respectively. Pracoviště Ústav fyzikální chemie J.Heyrovského Kontakt Michaela Knapová, michaela.knapova@jh-inst.cas.cz, Tel.: 266 053 196 Rok sběru 2011
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