Počet záznamů: 1
RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI
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SYSNO ASEP 0315789 Zařazení RIV Záznam nebyl označen do RIV Název RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI Překlad názvu RBS, UV-VIS a XPS charakterizace Ni+ 40 keV implantovaných polymerů PEEK, PET a PI Tvůrce(i) Macková, Anna (UJF-V) RID, ORCID, SAI
Bočan, Jiří (UJF-V)
Khaibullin, R. I. (RU)
Švorčík, V. (CZ)
Slepička, P. (CZ)
Siegel, J. (CZ)
Valeev, V. F. (RU)Zdroj.dok. 16th International Conference on Ion Beam Modification of Materials Book of Abstracts. - Dresden : Institute of Ion Beam Physics and Materials Research, Forschungzentrum Dresden-Rossendorf, 2008
S. 317-317Poč.str. 1 s. Akce 16th International Conference on Ion Beam Modification of Materials Datum konání 31.08.2008-05.09.2008 Místo konání Dresden Země DE - Německo Typ akce WRD Jazyk dok. eng - angličtina Země vyd. DE - Německo Klíč. slova ion implantation in polymers ; TRIDYN ; Ion Beam Analysis ; UV-VIS, XPS Vědní obor RIV JI - Kompozitní materiály CEP KJB100480601 GA AV ČR - Akademie věd LC06041 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy CEZ AV0Z10480505 - UJF-V (2005-2011) Anotace Polyimide (PI), polyetheretherketone (PEEK), and polyethyleneterephtalate (PET) were implanted with 40 keV Ni+ ions at room temperature at fluences from 1,0 . 1016 ions cm-2 to 1,5 . 1017 ions cm-2 and at different ion currents from 4microA to 10microA. The depth profiles of implanted Ni atoms determined by RBS technique are compared with those predicted by SRIM and TRIDYN codes. Hydrogen depletion as a function of the ion fluence was determined by ERDA technique and compositional and structural changes of the polymers were characterized by UV-VIS and XPS methods. The implanted profiles differ significantly from those predicted by the SRIM code and for lower fluences they can satisfactorily be described by the TRIDYN simulation. A significant hydrogen escape is observed from the polymer surface layer together with significant changes in the surface layer composition. UV-VIS results indicate an increase in the concentration and conjugation of double bonds. Pracoviště Ústav jaderné fyziky Kontakt Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Rok sběru 2009
Počet záznamů: 1