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Absolute Distance Measurements with Tunable Semiconductor Laser
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SYSNO ASEP 0022378 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Absolute Distance Measurements with Tunable Semiconductor Laser Překlad názvu Absolute distance measurements with tunable semiconductor laser Tvůrce(i) Mikel, Břetislav (UPT-D) RID, SAI
Číp, Ondřej (UPT-D) RID, SAI, ORCID
Lazar, Josef (UPT-D) RID, ORCID, SAIZdroj.dok. Physica Scripta. - : Institute of Physics Publishing - ISSN 0031-8949
T118, - (2005), s. 41-44Poč.str. 4 s. Jazyk dok. eng - angličtina Země vyd. SE - Švédsko Klíč. slova tunable laser ; absolute interferometer Vědní obor RIV BH - Optika, masery a lasery CEP IAB2065001 GA AV ČR - Akademie věd UT WOS 000236906800011 Anotace The work is oriented to development of the absolute distance interferometer with a narrow-linewidth tunable VCSEL laser (Vertical-Cavity Surface-Emitting Laser) at 760 nm and a wavelength-scanning interferometry technique improved by an amplitude division of interference fringe. This laser performs the mod-hop free tuning range up to 1.4 nm and a value of the injection current controls the wavelength. With respect to a high-sensitivity of the emitted wavelength to the injection current fluctuation, we provided the stabilization of laser frequency by means of an electronic frequency lock to modes of the Fabry-Perot glass etalon. Instantaneous values of the interference phase before and after the scanning process are recorded for a longer interval due to data averaging. For the first laboratory experiments, we have measured preliminary results with relative uncertainty of absolute distance measurement at 8.10-5 level. Pracoviště Ústav přístrojové techniky Kontakt Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Rok sběru 2006
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