Formation of CuIn.sub.1−x./sub.Al.sub.x./sub.Se.sub.2./sub. thin films studied by Raman scattering

Olejníček, Jiří - Kamler, C.A. - Darveau, S.A. - Exstrom, C.L. - Slaymaker, L.E. - Vandeventer, A.R. - Ianno, N.J. - Soukup, R. J.
Formation of CuIn_1−xAl_xSe₂ thin films studied by Raman scattering.
Thin Solid Films. Roč. 519, č. 16 (2011), s. 5329-5334. ISSN 0040-6090. E-ISSN 1879-2731
Impakt faktor: 1.890, rok: 2011
http://hdl.handle.net/11104/0208194