Počet záznamů: 1
Recovery stress and shape memory stability in Ni-Ti-Cu thin wires at high temperatures
- 1.Molnár, Peter - Van Humbeeck, J.
Recovery stress and shape memory stability in Ni-Ti-Cu thin wires at high temperatures.
International Journal of Materials Research. Roč. 102, č. 11 (2011), s. 1362-1368. ISSN 1862-5282. E-ISSN 2195-8556
Impakt faktor: 0.830, rok: 2011
http://www.ijmr.de/directlink.asp?MK110596
http://hdl.handle.net/11104/0202767
Počet záznamů: 1