Počet záznamů: 1
Nanometrology Interferometric System for Local Probe Microscopy
- 1.Hrabina, Jan - Lazar, Josef - Číp, Ondřej - Klapetek, P.
Nanometrology Interferometric System for Local Probe Microscopy.
Proceedings of the 20th IMEKO TC2 Symposium on Photonics in Measurement. Aachen: Shaker Verlag, 2011, s. 17-20. ISBN 978-3-8440-0058-0.
[IMEKO TC2 Symposium on Photonics in Measurement /20./. Linz (AT), 16.05.2011-18.05.2011]
http://hdl.handle.net/11104/0202571
Počet záznamů: 1