Počet záznamů: 1
Imaging of thermal treated thin films on silicon substrate in the scanning low energy electron microscope
- 1.Zobačová, Jitka - Mikmeková, Šárka - Polčák, J. - Frank, Luděk
Imaging of thermal treated thin films on silicon substrate in the scanning low energy electron microscope.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 69-70. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350672_01.pdf
http://hdl.handle.net/11104/0190612
Počet záznamů: 1