Počet záznamů: 1
Scanning low energy electron microscopy of doped silicon at units of eV
- 1.Hovorka, Miloš - Mikmeková, Šárka - Frank, Luděk
Scanning low energy electron microscopy of doped silicon at units of eV.
6th International Workshop on LEEM/PEEM. Trieste: ELETTRA, 2008. s. 110. ISBN N.
[International Workshop on LEEM/PEEM /6./. 07.09.2008-11.09.2008, Trieste]
http://hdl.handle.net/11104/0180232
Počet záznamů: 1