Počet záznamů: 1
Contrast Generation in Low Energy SEM Imaging of Doped Semiconductor
- 1.Mika, Filip - Frank, Luděk
Contrast Generation in Low Energy SEM Imaging of Doped Semiconductor.
Proceedings of the 9th International Seminar Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, 2004 - (Müllerová, I.), s. 51-52. ISBN 80-239-3246-2.
[Recent Trends /9./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 12.07.2004-16.07.2004]
http://hdl.handle.net/11104/0016159
Počet záznamů: 1