Počet záznamů: 1
Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy
- 1.Zemek, Josef - Houdková, Jana - Jiříček, Petr - Ižák, Tibor - Kalbáč, Martin
Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy.
Applied Surface Science. Roč. 491, Oct (2019), s. 16-23. ISSN 0169-4332. E-ISSN 1873-5584
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 6.182, rok: 2019
Způsob publikování: Omezený přístup
https://doi.org/10.1016/j.apsusc.2019.06.083
http://hdl.handle.net/11104/0305033
Počet záznamů: 1