Počet záznamů: 1
Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?
- 1.Rodenburg, C. - Masters, R. - Abrams, K. - Dapor, M. - Krátký, Stanislav - Mika, Filip
Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 68-69. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
Obor OECD: Coating and films
http://hdl.handle.net/11104/0288492
Počet záznamů: 1